Supported by statistical data analysis and process capability indices Cp, Cpk.
- Tests are performed conforming to IEC 60747 and others for Si, SiC and GaN i.e. normal and Wide Bandgap Semiconductor
- User friendly Interface to quickly become productive and powerful test program script language for flexibility
- Single or double pulse test on inductive load
- Test result data is saved to excel / XML format for analysis as well as tight process control and also for sharing Test Data with customer
- Operating System: Windows 11 or higher
- Remote Service assistance on TeamViewer for diagnosis and software upgrade
- Interface will be provided for any device handlers
- Simple drag and drop to change characterization sequence
- Testing for 2 level / 3 level inverter configuration is also optionally available.
- High speed optical Probes for accurate reading and to reduce common mode noise. This is very essential for SiC and GaNFET
- Barcode reader based and temperature controlled (150 degrees Celsius or more) Test fixtures/Jigs will be provided as an option for various packages like complex modules, discrete or bare dies.
- Self-diagnosis for lower mean-time-to-restoration (MTTR)
- Oscilloscope used for measurement will be 350 MHz or higher
- Automatic selectable gate resistors on the fly (from 1 ohm to 255 ohms or from 0.5 ohm to 127 ohms) by test program. These gate resistors can be selected to be different for turn-on and turn-off.
- Very low stray inductance to minimize voltage overshoot.